IAI Forensic Training Opportunities TRITECHFORENSICS is the Official Training Partner of the IAI New courses are continually being added If your agency is interested in hosting a course, please contact Mr. Phil Sanfilippo at phil@tritechusa.com or 800-438-7884 ext. 1025
We are the oldest and largest forensic association in the world. This professional forensic association represents a diverse, knowledgeable and experienced membership that are assembled to educate, share, critique and publish methods, techniques and research in the physical forensic science disciplines. For information about IAI forensic science disciplines such as Crime Scene Investigation ...
Welcome to the IAI Forensic Certification Homepage Each program consists of a rigorous educational process, a certification procedure, and re-certification requirements. Each is administered by a certification board comprised of experts in the discipline. All programs operate under the supervision of the Forensic Certification Management Board (FCMB), a sub-division of the International ...
The IAI Conference is the largest in the world for Forensic and Crime Scene Professionals and offers a full week packed with scientific, technical and operational lectures, as well as hands-on workshops focused on a wide variety of topics. Topics include Crime Scene Investigation and Processing, Photography, the collection and examination of Latent Print, Footwear and Tire Track, and ...
Useful Information FAQs Approved Training Courses (04/23/2026) Approved courses are not an endorsement of the training by the IAI/FCMB. Approval indicates topics are within the scheme of a certification and the instructor has training in the topics taught. Certified Crime Scene Rosters
The IAI conference is a premier opportunity for experts in these fields to stay up to date on the latest techniques, technologies and challenges in forensic science, as well as to learn more about quality assurance, standards development, and the most comprehensive forensic certification program in the world.